Resumen:
Boron-modified TiO2 thin films with different boron contents were obtained by the spin coating technique.
Chemical composition and bonding were determined by X-ray photoelectron spectroscopy (XPS). Raman, UV–visible
and photoluminescence spectroscopies were used to characterize the deposited films. XPS results revealed that the boron
content varied from 2.1 to 9.0 at% and that Ti-O-B bonds are formed at the highest content. Raman spectra showed that
incorporation of B in the titania lattice improved the crystallinity of the anatase phase and promoted a decrease in the
crystallite size. Photoluminescence characterization indicated a quenching of the electron–hole recombination rate due to
boron incorporation. The photocatalytic activity improved with films modified with B under solar-simulated irradiation.